Atomic force microscopy

An Atomic Force Microscope (AFM) uses a cantilever with a very sharp tip to scan over a sample surface. As the tip approaches the surface, the close-range, attractive force between the surface and the tip cause the cantilever to deflect towards the surface. However, as the cantilever is brought even closer to the surface, such that the tip makes contact with it, increasingly repulsive force takes over and causes the cantilever to deflect away from the surface. Depending on the tip different forces can affect it and instead of the topology of the surface e.g. the magnetic or electrostatic properties of the surface can be imaged. These are magnetic force microscopy (MFM) and electrostatic force microscopy (EFM). Also other applications exist.

For more information, contact Hannu Huhtinen.

Measurement modes: non-contact, contact, tapping, Kelvin probe, conductive AFM, nanoindentation, liquid cell and electrochemistry cell. Includes optical microscope. Contact person Mikko Salomäki

For more information, contact  Mikko Salomäki.