X-ray diffraction (XRD)

Malvern Panalytical Empyrean

X-ray diffraction is based on the interference of x-rays in the crystal lattice of the samples. It can be used for phase identification, determination of the grain size and strain in the sample. The sample can be turned in different angles and cooled and heated up to study phase transitions. The same device can be used for x-ray reflectivity measurements to determine the thickness, density and roughness of thin films (typically < 100 nm).

For more information, contact Petriina Paturi.

Specifications:

  • Cu x-ray tube, PixCel 3D and proportional counter detectors and Bragg-Brentano HD monochromator
  • 5-axis goniometer
  • Possibility for measurements in temperature range 77 – 1700 K
  • Available databases: ICSD and Crystallography Open Database.
  • Analysis software: HighScore Plus

For more information, contact Petriina Paturi.

Malvern Panalytical Aeris

This is an X-ray powder diffractometer for routine analysis of polycrystalline samples. It can be used for qualitative and quantitative phase analysis, crystallite/domain size determination, structure solution and refinement.

For more information, contact Mika Lastusaari.

Specifications:

  • Cu x-ray tube
  • Reflection geometry.
  • Room temperature measurements.
  • Available databases: Powder Diffraction File 4+ and Crystallography Open Database.
  • Analysis software: HighScore.

For more information, contact Mika Lastusaari.